Professor Way Kuo Co-Authors New Book on Nanoelectronics Manufacturing

03 Sep 2026

Professor Way Kuo, Senior Fellow of the Hong Kong Institute for Advanced Study (HKIAS) at City University of Hong Kong, has co-authored Reliability and Yield in Nanoelectronics Manufacturing with Dr. Wei-Ting Jan, a distinguished expert in semiconductor manufacturing.

The book brings together academic insight and industrial experience to examine two critical considerations in advanced semiconductor production: reliability and yield. It offers timely perspectives on the challenges of manufacturing increasingly miniaturised electronic devices and the importance of strengthening quality, performance and efficiency across the production process.

A book launch event was held on 3 September 2026 in City University of Hong Kong, attracting around 350 guests from academia, industry, government and the wider community. The programme included an academicians’ forum and a panel discussion on technology innovation ecosystems and internationalisation, providing a platform for exchange on how research, industry collaboration and talent development can support future advances in microelectronics.

The publication reflects Professor Kuo’s long-standing contributions to reliability engineering and his commitment to advancing knowledge at the interface of research and real-world application.

 

 

Professor Way Kuo delivers remarks at the book launch of Reliability and Yield in Nanoelectronics Manufacturing.

 

Professor Way Kuo joins distinguished guests for a group photo at the book launch.

 
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