Zhu-Jun Wang is an expert on both electron microscopy and heterogeneous catalysis. He has successfully constructed the surface sensitive near-ambient-pressure in-situ scanning electron microscopy (SEM) during his doctoral research. With this technique, the detailed atomic-scale information obtained by in-situ transmission electron microscopy (TEM)/ scanning tunneling microscopy (STM) can be embedded within the global picture obtained at lower magnifications by in-situ SEM and subsequently correlated with the spectroscopic data from near ambient pressure in-situ X-ray photoelectron spectroscopy (NAP-XPS). This multi-scale approach enables to investigate the dynamic nature of catalyst during the ongoing work, bridges the pressure-gap, and links atomistic details to collective processes. One typical work is the analysis of surface dynamics, from the micrometer- to the atomic-scale, at well-controlled experimental environments to obtain a fundamental understanding of the mechanism of graphene and two dimensional (2D) materials growth on metal catalyst.